EMG Schematic Layout Cleanup


Thought for 3 mins 20 sec
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Managing 1 task
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2/2 Verify schematic readability and unchanged electrical connections; identify remaining cleanup.

Arrange and draw all functional blocks without changing connectivity.

Verify schematic readability and unchanged electrical connections; identify remaining cleanup.

Thought for 10 sec
Awaiting 1 task
"Schematic Drafting Review" completed.
The connectivity comparison confirms that all 49 nets still connect the same pins. The readability check found more work in the op-amp stages and electrode-jack wiring, which I’m correcting now.
Thought for 26 mins 21 sec
Thought for 8 sec
Awaiting 1 task
"STM32 EMG Schematic Layout" completed.
The analog stages now have drawn signal paths, but a wire-placement bug on flipped symbols is blocking part of the USB drawing. I’ll leave the affected connections labeled and finish the independent label fixes; the bug needs Contact Support.
Thought for 8 mins 11 sec
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Thought for 9 sec
Awaiting 1 task
"STM32 EMG Schematic Layout" completed.
I arranged all 78 components into eight functional blocks and added local wires and net labels. All 49 nets retain exactly the same pin connections; no electrical connections changed.
The drawing is not fully clean: wire crossings and label crowding remain, and a flipped-symbol wire-placement bug blocks the shared USB power wire. That bug needs Contact Support; the remaining drafting cleanup is still open.

Project Specification
Baseline and architecture
Implemented capture 07d2baa4, 2026-10-28: 71 components / 44 electrically connected nets. U3 AD8232ACPZ-RL provides a fixed-gain INA, servo high-pass, reference, postamp and driven reference. U4 MCP6002-E/SN implements two unity Sallen–Key sections. U1 STM32F401CEU6 records one differential surface-EMG channel.
Safety boundary
Electrode simulator only until qualified whole-system approval. No onboard isolation exists. External USB power and data isolation, shield, SWD, instruments, alternate returns, leakage and normal/single-fault behavior must be verified before any human connection. No medical compliance claim. J1 remains SJ-3524-SMT-TR: tip pin 2 positive, ring pin 3 negative, sleeve pin 1 driven reference never GND, switch pin 4 NC. No GPIO detection.
Design targets
  • Each signal leg: two 180 kΩ, 1%, 0402 resistors with midpoint clamp; 10 MΩ bias to VMID; 47 pF differential and 10 pF common-mode filtering.
  • Servo: R16 = 8.06 MΩ, 1%; C23 = 100 nF, 5%, C0G, exact GRM31C5C2A104JA01L, 1206. Manufacturer corner 100/(2πRC) = 19.7463 Hz; passive endpoints 18.6198–20.9955 Hz.
  • J4 open / shunted: postgain 1 / 5.02, nominal total 100 / 502, using 402 kΩ / 100 kΩ, 0.1%. Jumper state is manually recorded.
  • LP1: 287 kΩ each, 1.2 nF feedback / 1 nF shunt. LP2: 549 kΩ each, 1.5 nF feedback / 220 pF shunt. Resistors 1%, capacitors 5% C0G, all 0402; lower Q first.
  • Approximate 20–500 Hz acquisition band, not an exact production 500 Hz mask. Native behavioral peaks 96.587 / 484.834 V/V; −3.000 dB bands 19.817–497.715 / 19.814–497.658 Hz.
  • Driven reference: C30 = 10 nF, two 200 kΩ limiters, D5 at midpoint. Real-loop stability remains unvalidated despite bounded model margins.
  • ADC1_IN0 / PA0, 12 bits, 8 kS/s timer/DMA, 21 MHz ADC clock and 480-cycle acquisition target; R24 / C28 = 100 Ω / 1 nF.
  • Normal input 4.75–5.25 V, externally isolated; TPS7A2033 regulator and 10 Ω analog filter. The 60 mA design envelope is an assumption to verify.
  • All 26 ordinary resistors 0402. C1/C4/C5/C10/C11 remain 0603 pending effective-C/ESR qualification; F1 remains 0805 PPTC; C23 is the sourced stable 1206 exception.
Acceptance and release
Read-only pin/net/property verification and ERC completed: 0 errors / 1 existing D4 pin-type warning. Native behavioral AC/DC/linear transient and bounded analytical noise/alias/tolerance/RLD calculations are completed, not physical qualification. No official nonlinear AD8232 model was executed.
Release requires exact procurement/effective-C/derating/pad qualification; complete layout/routing/DRC; measured supply/inrush/load/thermal and reference behavior; all-node headroom and offset/artifact/open-lead recovery; complete noise/alias/ADC ENOB; switched ADC settling; actual RLD return ratio; defined-pulse ESD/backpower tests; qualified whole-system isolation/leakage/fault approval. Provisional ADC target: residual <0.25 LSB, about 195 µV at 3.2 V, by acquisition end without sustained ringing.
Simulation Guide contains all 71 parts, IC pin maps, equations, evidence and test conditions. Passive Package Qualification contains every resistor stress screen. No firmware or scripts are deliverables.
  • Baseline and architecture

  • Safety boundary

  • Design targets

  • Acceptance and release