• MKL28Z512VLL7

    MKL28Z512VLL7

    Kinetis KL28 series, 72...96-MHz/32-bit ARM Cortex-M0+, 512 kB flash, 128 kB SRAM, USB FS Device (xtal-less), LQFP-100 Kinetis KL28 ARM Cortex M0+ LQFP*14x14mm*P0.5mm*

    1 Comment


  • ADR1399KEZ

    ADR1399KEZ

    Oven-Compensated, Buried Zener, 7.05 V Voltage Reference, LCC-8 Zener diode device voltage reference Analog*LCC?8*5x5mm*P1.27mm*

    1 Comment


  • HSN-1000F

    HSN-1000F

    Nuclear Event Detector HSN-1000 Flatpack Package. Maxwell Technologies’ HSN-1000 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20ns. The active low Nuclear Event Detection signal (NED) is used to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps.

    jharwinbarrozo

    2 Uses


  • MKL27Z256VLH4

    MKL27Z256VLH4

    Kinetis KL27 series, 48-MHz/32-bit ARM Cortex-M0+, 256 kB flash, 32 kB SRAM, USB FS Device (xtal-less)/OTG, LQFP-64 Kinetis KL27 ARM Cortex M0+ LQFP*10x10mm*P0.5mm*

    1 Comment


  • MKL43Z256VLH4

    MKL43Z256VLH4

    Kinetis KL43 series, 48-MHz/32-bit ARM Cortex-M0+, 256 kB flash, 32 kB SRAM, USB FS Device (xtal-less), Segment LCD, FlexIO, LQFP-64 Kinetis KL43 ARM Cortex M0+ LQFP*10x10mm*P0.5mm*

    1 Comment


  • MKL27Z64VLH4

    MKL27Z64VLH4

    Kinetis KL27 series, 48-MHz/32-bit ARM Cortex-M0+, 64 kB flash, 16 kB SRAM, USB FS Device (xtal-less)/OTG, LQFP-64 Kinetis KL27 ARM Cortex M0+ LQFP*10x10mm*P0.5mm*

    1 Comment


  • MKL27Z256VFT4

    MKL27Z256VFT4

    Kinetis KL27 series, 48-MHz/32-bit ARM Cortex-M0+, 256 kB flash, 32 kB SRAM, USB FS Device (xtal-less)/OTG, QFN-48 Kinetis KL27 ARM Cortex M0+ QFN*7x7mm*P0.5mm*

    1 Comment


  • THAT1646S08-U

    THAT1646S08-U

    Compact Dual THAT1646 Balanced Line Driver with Flexible Power Supply and Enhanced Protection

    67 Uses


  • UGN3177UA

    UGN3177UA

    These Hall-effect latches are temperature-stable and stress-resistant sensors especially suited for electronic commutation in brushless dc motors using multipole ring magnets. Each device includes a voltage regulator, quadratic Hall voltage generator, temperature compensation circuit, signal amplifier, Schmitt trigger, and an open-collector output on a single silicon chip. The on-board regulator permits operation with supply voltages of 4.5 volts to 18 volts. The switch output can sink 10 mA. With suitable output pull up, they can be used directly with bipolar or MOS logic circuits.

    5 Uses


  • TCD1304AP

    TCD1304AP

    CCD LINEAR IMAGE SENSOR CCD(Charge Coupled Device) #CommonPartsLibrary #IntegratedCircuit


  • ISOM8-320-B-L2

    ISOM8-320-B-L2

    GDT, MOV TVS Device 1 Circuit 875V Through Hole Disc 23mm #commonpartslibrary #circuitprotection #tvs

    1 Use