Project Cover Page
Screenshot 2026-07-10 at 11.04.28 a.m. Background Removed.png
Table
| Rail | Source | Expected | Measure At | Initial Limit | Pass Criteria |
|---|---|---|---|---|---|
| +5V_RAW | J2 pin 1 | 5.0 V | F1 P1 | 100 mA | 4.75–5.25 V |
| +5V | F1 P2 | near 5.0 V | C5 P1 | 100 mA | within 0.15 V of +5V_RAW at idle |
| GND | J2 pin 2 | 0 V | C5 P2 | — | continuity below 1 Ω |
Table
| Signal | Expected Idle State | Probe Location |
|---|---|---|
| BLANK_IN | HIGH | U4 4A |
| BLANK_5V | HIGH | U1/U2 OE |
| ROW_ENABLE_N | HIGH | U3 E1 |
| ROW_GATE_0–9 | HIGH | U3 Y0–Y9 |
| PMOS_GATE_0–9 | HIGH | Q1–Q10 gates |
Table
| Connector | Pins | Test |
|---|---|---|
| J2 | 1 = +5V_RAW, 2 = GND | polarity and continuity |
| J1 | 2/4 = GND; 3 DATA; 5 CLK; 6 LATCH; 7 BLANK; 8–11 ROW_A0–A3; 12 ROW_ENABLE_N; 13 SDO_3V3 | continuity to series resistors and destination logic |
Table
| Test | Input | Expected Result | Pass Criteria |
|---|---|---|---|
| Single pixel | one column bit, row 0 | D1 only | no adjacent-row/column glow |
| Row walk | all columns on, rows 0–9 | one complete row at a time | no overlap or ghosting |
| Column walk | each column individually | one vertical column | correct mapping COL0–COL9 |
| Full pattern | all ten columns for every row | all pixels visually uniform | supply current approximately 200–250 mA |
| SDO level | logic HIGH shifted through chain | J1 pin 13 | 3.0–3.6 V |
Table
| Section | Result | Notes |
|---|---|---|
| Visual inspection | [ ] Pass / [ ] Fail | |
| Power rails | [ ] Pass / [ ] Fail | |
| Idle safety states | [ ] Pass / [ ] Fail | |
| Connector mapping | [ ] Pass / [ ] Fail | |
| Pixel/row/column tests | [ ] Pass / [ ] Fail | |
| Current and ripple | [ ] Pass / [ ] Fail |
Prerequisites
1. Visual Inspection
2. Power Rail Verification
3. Critical Signal Verification
4. Connector Tests
5. Controller Test Sequence
6. Functional Validation
7. Oscilloscope Checks
Pass/Fail Summary